Add more extensive test program

This commit is contained in:
Avishay
2014-01-13 23:12:37 +02:00
parent 4e4b3bd924
commit 3819c57cde
+40 -3
View File
@@ -1,22 +1,59 @@
#include <Arduino.h>
#include <TM1637Display.h>
// Module connection pins (Digital Pins)
#define CLK 2
#define DIO 3
// The amount of time (in milliseconds) between tests
#define TEST_DELAY 2000
TM1637Display display(CLK, DIO);
void setup()
{
pinMode(13,OUTPUT);
}
void loop()
{
uint8_t data[] = { 0xff, 0x06, 0x00, 0xff };
int k;
uint8_t data[] = { 0xff, 0xff, 0xff, 0xff };
display.setBrightness(0x0f);
// All segments on
display.setSegments(data);
delay(TEST_DELAY);
// Selectively set different digits
data[0] = 0b01001001;
data[1] = display.encodeDigit(1);
data[2] = display.encodeDigit(2);
data[3] = display.encodeDigit(3);
for(k = 3; k >= 0; k--) {
display.setSegments(data, 1, k);
delay(TEST_DELAY);
}
display.setSegments(data+2, 2, 2);
delay(TEST_DELAY);
display.setSegments(data+2, 2, 1);
delay(TEST_DELAY);
display.setSegments(data+1, 3, 1);
delay(TEST_DELAY);
// Convert decimal to segments
// Without leading zero
bool lz = false;
for (uint8_t z = 0; z < 2; z++) {
for(k = 0; k < 10000; k += k*4 + 7) {
display.showNumberDec(k, lz);
delay(TEST_DELAY);
}
lz = true;
}
while(1);
}